IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision; while offering many capabilities and flexibility not available with traditional microscopes.

The IR-2200 system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.  This system provides all necessary features for high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.   Compatible objective lens include Seiwa M. Plan APO and PE IR Plan series.