Active Cantilever Scanning Microscopy

The atomic force microscope (AFM) is capable of imaging local material properties such as topology, friction, electrostatic interaction, electrical conductivity, magnetism etc.

Active Cantilever Scanning Microscopy

Active Cantilever Scanning Microscopy

Modular system components include damping, environmental chamber, positioning stage

SmartActiveProbe (cantilever) with active thermomechanical actuation for atomic resolution

Fastest SPM system in vacuum, air, and liquid

Cantilever head for fast plug-and-play cantilever exchange

Scanner and probe can be can be easily adapted to customer’s requirements